JSM 7001F PDF

The adoption of a High Power Optics irradiation system delivers high-resolution, high-speed, high-accuracy element analysis. The incorporation of the Gentle Beam enables top-surface imaging of a specimen at very low energies of several hundred eV. Semi-in-lens provides high-resolution observation and analysis High resolution observation and high spatial resolution analysis is achieved through the combination of a semi-in-lens type objective lens that can collimate the electron beam even at low accelerating voltages, and the in-lens Schottky electron source that provides a stable current over a long service life. Gentle Beam GB provides top-surface imaging with ultra-low energy incident electrons A Gentle Beam GB mode with better resolution than the normal mode is available. In GB mode a bias voltage is applied to the specimen while the electron beam is emitted, allowing top-surface imaging with only several hundred eV of incident electron, making it possible to obtain high resolution images of samples that have been difficult to observe until now.

Author:Tektilar Duzshura
Country:Barbados
Language:English (Spanish)
Genre:Technology
Published (Last):23 January 2015
Pages:218
PDF File Size:15.67 Mb
ePub File Size:8.15 Mb
ISBN:854-4-61496-535-5
Downloads:74520
Price:Free* [*Free Regsitration Required]
Uploader:Dotaur



.

BIOSEPARATIONS BY SIVASANKAR PDF

JEOL JSM-7001F

.

JOSEF PIEPER FOUR CARDINAL VIRTUES PDF

JSM-7900F Image Gallery

.

EDOUARD GLISSANT POETICS OF RELATION PDF

Centre for High Resolution Transmission Electron Microscopy

.

ANALISIS FRAMING ERIYANTO PDF

JSM-F100 Image Gallery

.

Related Articles